The main technical parameters:
Simulation photosource: high efficiency pulses X-eon -lamp (single pulse energy ≥1200J
Luminous intensity irregularity:≤±3%
Test area:2*2m
Test range :20-30W
Data acquisition speed:2ms
Data acquisition quantity:8000 data point(I-V curve)
Test instability :≤±0.5%
Test load:10A/50V
Test parameter:Voc,Isc, Pm , Im , FF , EFF
Test inaccuracy:≤2%
Equipment performance:
The equipment is specially used in testing solar energy mono-crystalline silicon, amorphous crystalline silicon ,and solar cell module.
Through stimulates the solar spectrum lamp-house,carries on the testing and surveys to the cell module related electrical parameter,according to the measurement result classifies the cell piece.
It has unique apparatus of modifying, to input the compensate parameter,it will carries on non touched way automatically/manual temperature compensation and compensate with the light intensity, and automatically measures and modifies the temperature.
Base on the windows operation surface,and humanized-design testing software, it records and displays test curve(I-v curve,P curve) and the test parameter (Voc,Isc, Pm , Im , FF , EFF), the outcome of the test is prompted by voice, and the sequence number is automatically product and preserved to the assigned folder.
|
